The 4200 scs offers the most advanced capabilities available in a fully integrated. Model 4200scs semiconductor characterization system technical note preparation and setup before the parameter wafer mapping feature can be used, the user must set up both the hardware and software of the controller and the prober. Model 4200 smu medium power source measure unit with or without the model 4200 pa remote preamp option. Refer to the user documentation for complete product specifications. Learn more about how the keithley 4200a scs parameter analyzer is the best tool for your research and analysis of semiconductor devices, materials and processes. The user manual for the 4200 scs describes basics of getting your system up and running.
The 4200scs offers the most advanced capabilities available in a fully integrated characterization system, including a. Electrical characterization of photovoltaic materials and solar cells with the keithley model 4200 scs semiconductor characterization system. Thanks to a new software driver, users can control the model 4200 scs semiconductor characterization system while operating within agilent technologies iccap device modeling software environment. Keithley 4200scs test equipment reference manual pdf view. Model 4200 scs f intuitive, pointandclick windowsbased environment unique remote preamps extend the resolution of smus to 0. View online reference manual for keithley 4200 scs test equipment or simply click download button to examine the keithley 4200 scs guidelines offline on your desktop or laptop computer. Model 4200scs semiconductor characterization system. Complete reference contains manuals, white papers, applications notes. The easytouse model 4200scs semiconductor characterization system performs lab. Model 4200 semiconductor characterization system 4200 scs to make cv measurements. The model 4225pmu ultra fast iv module is the latest addition to the growing range of instrumenta optional ultrafast voltage source and measurement unit for the model 4200 semiconductor characterization system tion options for the model 4200 scs semiconductor characterization system.
The model 4200 scs ktei combination is the industrys leading semiconductor characterization system. Semiconductor characterization system 4200 scs configured with the 4200 pa remote preamplifiers, offers exceptional low current measurement capability with a resolution of 0. This video is a system level overview of the basic operating hardware of the model 4200 scs semiconductor characterization system. Its advanced digital sweep parameter analyzer combines speed and accuracy for deep submicron characterization. Model 4200 scs semiconductor characterization system smus. This advanced parameter analyzer provides intuitive and sophisticated. The model 4200 semiconductor characterization system scs can. To learn more, download a free copy of our new application note, using the model 4200 cvupwr cv power package to make high voltage and high current cv measurements with the model 4200 scs semiconductor characterization system at. For additional information, refer to the manual for your cv analyzer and to the 4200 scs reference manual. Keithley interactive test environment kite is designed to let users. Application note gate dielectric capacitancevoltage. A single fault in the system can expose a person to lethal voltage. View and download keithley 4200scs reference manual online. These modules give lab users a fill in the blank interface to c language subroutines.
Ask for a quote on a used keithley 4200 scs f semiconductor analyzers from testequity at today. Model 2635b singlechannel system sourcemeter instrument. Even infrequent users can begin testing productively right away, without programming assistance. Model 4200a parameter analyzer users manual tektronix. Model 4225 integrates ultrafast voltage waveform generation and currentvoltage measurement capabilities into the model 4200 scs semiconductor characterization system. Model 4200scs semiconductor characterization system from. Four point probe iv electrical measurements using the. Semiconductor characterization system technical data. Application libraries included for every technology. Model 4200 scs software environment table 22 continued smu forcing function summary general type name description and graphical illustrations step current increments a current or voltage to two or more levels, each of which is held constant during the progress step of a current sweep, a voltage sweep.
Keithley instruments 4200 semiconductor characterization. The model 4200scs provides a total system solution for dc iv, cv. The 4200ascs offers the most advanced capabilities available in a fullyintegrated characterization system, including a complete, embedded computer with. Model 4200a scs semiconductor characterization system quick start guide. Model 4200 scs semiconductor characterization system declassification and security instructions page 4 of 8 0774300 september 2016 memory devices the following tables list the volatile and nonvolatile memory devices in the standard instrument and listed options.
With unmatched product selections, testequity offers everything you need to get the job done. Wafer level advanced parameter measurement system signatone. This lecture is part of a training session for the keithley 4200scs semiconductor characterization system. This advanced parameter analyzer provides intuitive and sophisticated capabilities for semiconductor device characterization by combining unprecedented measurement sensitivity and accuracy with an embedded windows r. A manual prober mode prompts the operator to perform prober opera. Model 4200 scs semiconductor characterization system declassification and security instructions instructions. The zyvex test system employs a keithley model 4200 semiconductor characterization system scs which is an automated instrument designed to provide iv and cv characterization of semiconductor devices and test structures. This lecture is part of a training session for the keithley 4200scs semiconductor. The 4200 scs is a measurement system that includes instruments for both iv and cv measurements, as well as software, graphics, and mathematical analysis capability. Device characterization with the keithley model 4200scs.
The easytouse model 4200scs semiconductor characterization system performs lab grade dc and pulse device characterization, realtime plotting, and analysis with high precision and subfemtoamp resolution. Kult the keithley user library tool kult allows test engineers to. Keithley and certain third party suppliers the owners own all right, title and interest in. Using the wafer map parameters option with cascade. It also addresses basic mos physics, proper cv measurement techniques, and parameter extraction from cv test results. The software of the system is a keithley interactive test environment kite for device characterization application. The 4200 scs reference manual provide indepth information to help you operate the 4200 scs semiconductor characterization system. Capacitancevoltage cv measurements are commonly used in studying gateoxide quality in detail. Keithley 4200scsf semiconductor characterization system. This document gives the recommended sequence for customer selfpaced elearning and tooling setup that keithley has found to be effective and efficient for training new users of the keithley model 4200 scs semiconductor. V characterization of mos capacitors using the model 4200. The model 4200 scs is a total system solution for electrical characterization of devices, materials and semiconductor processes.
Model 4200 scs technical data semiconductor 4 4200scs semiconductor characterization system con. Ieee488 interface allows the model 4200scs to control. Model 4200 scs technical data s e m i cond u c t or a greater measure of confidence 4200 s cs semiconductor characterization system technical data configuration options the 4200 scs supports many instrument configurations that can include smus, cv measurement units, pulse generators, and oscilloscopes. Model 4200a scs parameter analyzer user s manual table of contents. Kite is the primary user interface for the keithley instruments model 4200 semiconductor characterization system scs. The reference manual for the 4200 scs includes all operation and maintenance information for the system. The keithley interactive test environment allows users to gain familiarity quickly with. Semiconductor characterization system technical data helmar. Keithley model 4200scs semiconductor characterization. The 4200 scs offers the most advanced capabilities available in a fully integrated characterization system. Table of contents model 4200a scs parameter analyzer user s manual. Model 4200scs semiconductor characterization system declassification and security instructions instructions. Diode characterization on keithley 4200scs youtube. Keithley 4200scs semiconductor characterization system.
Customer selfpaced elearning sequence for keithley model 4200 scs semiconductor characterization system overview. We are offering for sale a keithley 4200 scs semiconductor characterization system consisting of. The easytouse model 4200scs semiconductor characterization system performs lab grade dc device characterization, realtime plotting, and analysis with high precision and subfemtoamp resolution. Realtime auto scaling, end of test auto scaling, or manual scaling. Lab grade dc device characterization the easytouse model 4200 scs semiconductor characterization system performs lab grade dc iv, cv, and pulse device characterization, realtime plotting, and analysis with high precision and subfemtoamp resolution. Always remove power from the entire test system and discharge any capacitors before. Keithley user library tool kultallows test engineers to integrate custom.